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K·p微扰论

K·p微扰论又名K·p微扰法,是固体物理中用来计算固体能带结构和光学性质的一种微扰方法,因微扰哈密顿算符中出现了正比于简约波矢(k)与动量算符(p)内积的项而得名。该方法可以近似估计半导体中的电子在导带底的有效质量[1][2]

背景

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在晶体中,势场具有周期性,如果给其中电子的波函数加以周期性边界条件,则波函数将具有布洛赫波的形式:[1]

其中是简约波矢,是周期函数,且周期与晶格的周期完全相同。[1]

将该表达式代入定态薛定谔方程,可得满足的方程。该方程在形式上类似于定态薛定谔方程:[1]

其“哈密顿算符”为:

微扰方法

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K·p微扰论适用于简约波矢较小的情形下。此时可将“哈密顿算符”中不含有简约波矢的项视为无微扰的“哈密顿算符”,把含有简约波矢的项视为“微扰哈密顿算符”,即:[1]

利用微扰方法可以用所有的线性组合表达某个能带的,进而给出能量与简约波矢的近似关系。如果是不简并的,考虑到一级修正后的表达式为:[1]

考虑二级修正以后能量的表达式为:[1]

电子的倒有效质量张量近似为:[1]

应用

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直接带隙半导体中,导带底部的电子对应的简约波矢为零,它的有效质量可运用K·p微扰论近似计算。微扰论中最近邻态的微扰贡献最大。导带底和价带顶的态互为最近邻态,仅考虑彼此的微扰贡献,K·p微扰论的结果可进一步简化为:[1]

式中为导带底与价带顶的能量差,即带隙;脚标v和c分别指代价带顶与导带底的态。如果所考虑的导带底是旋转对称的,倒有效质量张量可以用一个标量代替:[1]

表明半导体的带隙越小,导带底电子有效质量也越小。对通常的半导体来说,导带底电子的有效质量远小于电子的真实质量,且矩阵元与电子真实质量的比值近似为一个常量10eV。故:[1]

该公式给出的导带底电子有效质量近似值与绝大多数IV族、III-V族、II-VI族直接带隙半导体实测值的误差在15%以内。[3]

推广

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如果考虑自旋-轨道作用,仍然可以用类似方法处理。此时“哈密顿算符”应写为:[2]

如果有简并,需要使用简并微扰理论。[4]Luttinger–Kohn模型英语Luttinger–Kohn model可以处理这类问题。[5]

参见

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参考文献

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  1. ^ 1.00 1.01 1.02 1.03 1.04 1.05 1.06 1.07 1.08 1.09 1.10 黄昆、韩汝琦. 固体物理学. 高等教育出版社. 1988: p328. 
  2. ^ 2.0 2.1 C. Kittel. Quantum Theory of Solids Second Revised Printing. New York: Wiley. 1987: 186–190. ISBN 0-471-62412-8. 
  3. ^ 参见Fundamentals of Semiconductors: Physics and Materials Properties页面存档备份,存于互联网档案馆)一书中表2.22
  4. ^ P. Yu, M. Cardona. Fundamentals of Semiconductors: Physics and Materials Properties 3rd. Springer. 2005. Section 2.6, pp. 68 ff' [2016-06-19]. ISBN 3-540-25470-6. (原始内容存档于2017-04-21). 
  5. ^ J. M. Luttinger, W. Kohn. Motion of Electrons and Holes in Perturbed Periodic Fields. Physical Review. 1955, 97: 869. Bibcode:1955PhRv...97..869L. doi:10.1103/PhysRev.97.869. 
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K·p微扰论
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