近場掃描光學顯微鏡
近场扫描光学显微镜 (NSOM/SNOM)是一个 显微镜 技术，用于结构调查，其利用渐逝波的特性打破远场中繞射極限 。 在SNOM， 激发激光光透过一个直径小于雷射波长的孔徑聚焦，从而在孔徑的遠端產生消逝场。[3] 当样品在短距離地在孔徑下扫描，光學解析度只跟孔径的直徑有關。 此時，横向分辨率可達20 纳米、垂直分辨率可達2-5 纳米。[4][5]
如光学显微镜、此机制可以用於研究的不同性质，例如 折射率、化学结构和侷域压力。也可以研究在次波長解析度下的动态特性。
NSOM/SNOM是一种扫描探针显微镜.
参考文献
[编辑]- ^ (学位论文). 缺少或
|title=为空 (帮助) - ^ Bao, Wei; Borys, Nicholas J.; Ko, Changhyun; Suh, Joonki; Fan, Wen; Thron, Andrew; Zhang, Yingjie; Buyanin, Alexander; Zhang, Jie. Visualizing nanoscale excitonic relaxation properties of disordered edges and grain boundaries in monolayer molybdenum disulfide. Nature Communications. 2015, 6: 7993. Bibcode:2015NatCo...6E7993B. PMC 4557266
. PMID 26269394. doi:10.1038/ncomms8993.
- ^ Germany, WITec Wissenschaftliche Instrumente und Technologie GmbH, Ulm,. SNOM || WITec. www.witec.de. [2017-04-06]. （原始内容存档于2021-02-28） （美国英语）.
- ^ Dürig, U.; et al. Near-field optical scanning microscopy. J. Appl. Phys. 1986, 59 (10): 3318. Bibcode:1986JAP....59.3318D. doi:10.1063/1.336848.
- ^ Oshikane, Y.; et al. Observation of nanostructure by scanning near-field optical microscope with small sphere probe. Sci. Technol. Adv. Mater. (free access). 2007, 8 (3): 181. Bibcode:2007STAdM...8..181O. doi:10.1016/j.stam.2007.02.013.
外部链接
[编辑]- SNOM Scan Image Gallery. [2019-02-01]. （原始内容存档于2008-10-02）.
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